JEOL JSM-6010PLUS/LV Scanning Electron Microscope with Motorized X-Y Stage
Scanning Electron Microscope Specifications:
- Resolution: 4nm (at 20kV)
- Resolution in LV Mode: 5nm
- Magnification: 8X to 300,000X (5X possible)
- Accelerating voltage: 500V to 20kV
- Motorized X and Y stage
- Mini-environment/airlock for air sensitive samples
- Infrared Chamberscope with P-I-P
- Aztec Energy standard microanalysis system for qualitative and quantitative analysis
- Oxford INCA EDS XMAXN 80mm large area Analytical Silicon Drift Detector
- Hot Stage to 500C, with PID controller, water cooling, data acquisition and remote control, feed throughs (water, vacuum, electrical), sample holder, manufactured by Kammrath & Weiss Technologies, inc
